Cantilever Probe Card
Our cantilever probe card series uses ReW (tungsten-rhenium) and P7 alloy pins, designed for a variety of chip test needs, ensuring high precision and durability.
Best Cantilever Probe Card Manufacturer
About Cantilever Probe Card Features
- Achieve exceptional alignment and planarity with diagonal or shelf applications.
- Reduce thermal deformation during high and low-temperature tests.
- Accommodates 40 um pitch and 20/40 um staggered designs for flexibility.
- Maintain stable and low contact resistance with advanced probe materials and innovative design.
- Benefit from short lead times, ideal for engineering device testing.
How strong is the output we can handle
Our production capacity is your guarantee
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Upgrade your probe card performance with our expert PCB designs.
